Single-Spot
Measurements
Model Thickness
Range
Wavelength
Range
Standard
Spot Size

aRTie

Reflectance and/or transmittance measurement
Features: Compact, low-cost, non-UV systems have 40k-hour light source.
* Thickness measurement capability is optional.
aRTie 0.015-70 µm * 380-1050 nm 6000 μm
aRTie-UV 0.001-40 µm * 190-1100 nm 6000 μm

F3

Reflectance and film-thickness measurements
Features: Compact, low-cost, non-UV systems have 40k-hour light source.
* Thickness measurement capability is optional.
F3 0.015-70 µm * 380-1050 nm 100 μm
F3-NIR 0.1-250 µm * 950-1700 nm 100 μm
F3-UV 0.003-40 µm * 190-1100 nm 100 μm
F3-XT 0.2-450 µm * 1440-1690 nm 100 μm
F3-s980 10-1000 µm * 960-1000 nm 10 μm
F3-s1310 15-2000 µm * 1280-1340 nm 10 μm
F3-s1550 25-3000 µm * 1520-1580 nm 10 μm

F3-CP

Reflectance measurement of flat or curved samples
Features: Compact, low-cost, non-UV systems have 40k-hour light source.
* Thickness measurement capability is optional.
F3-CP 0.015-70 µm * 380-1050 nm 100 μm

F3-CS

Hands-free reflectance measurement of flat samples
Features: Compact, hands-free.
* Thickness measurement capability is optional.
F3-CS 0.015-70 µm * 380-1050 nm 100 μm

F10-AR

Reflectance measurement of large flat or curved samples
Features: Handheld probe for large samples and maximum versatility.
* Thickness measurement capability is optional.
F10-AR 0.2-15 µm * 380-1050 nm 100 μm
F10-AR-EXR 0.2-30 µm * 380-1700 nm 100 μm
F10-AR-NIR 0.5-30 µm * 950-1700 nm 100 μm
F10-AR-UV 0.1-15 µm * 190-1100 nm 100 μm
F10-AR-UVX 0.1-30 µm * 190-1700 nm 100 μm

F10-ARc

Reflectance measurement of AR coatings
Features: Includes color and reflectance alarms and hardcoat correction.
* Thickness measurement capability is optional.
F10-ARc 0.2-15 µm * 380-1050 nm 100 μm

F10-HC

Reflectance measurement of AR coatings
Features: Handheld probe for large samples and maximum versatility.
* Thickness measurement
F10-HC 0.05-70 µm * 380-1050 nm 200 μm
Single-Spot
Measurements
Model Thickness
Range
Wavelength
Range
Standard
Spot Size

F10-RT

Reflectance and/or transmittance measurement
Features: Accomodates larger samples than F2-RT, has built-in video.
* Thickness measurement capability is optional.
F10-RT 0.015-70 µm * 380-1050 nm 5000 μm
F10-RT-EXR 0.015-150 µm * 380-1700 nm 5000 μm
F10-RT-NIR 0.1-150 µm * 950-1700 nm 5000 μm
F10-RT-UV 0.003-40 µm * 190-1100 nm 5000 μm
F10-RT-UVX 0.003-150 µm * 190-1700 nm 5000 μm
In-line
Measurements
Model Thickness
Range
Wavelength
Range
Standard
Spot Size

F32

Compact solution for in-line measurements
Features: Includes spectrometer(s), software, and 10k-hour light source.
F32-s980 10-1000 µm * 960-1000 nm 10 μm
F32-s1310 15-2000 µm * 1280-1340 nm 10 μm
F32-s1550 25-3000 µm * 1520-1580 nm 10 μm