Product Description
Thin-film thickness of samples up to 450mm in diameter are mapped quickly and easily with the F50 advanced spectral reflectance system. The motorized R-Theta stage moves automatically to selected measurement points and provides thickness measurements as fast as two points per second. The high-precision, high-lifetime stage can perform millions of measurements and is well suited to production environments.
Product Features
- Industry-leading tabletop thin-film measurement systems
- Intuitive analysis software standard with every system
- Library with over 130 materials included with every system
- USB powered
- 24-hour (M-F) phone, email, and online support from highly trained application engineers
- System package includes integrated spectrometer/light source unit, flattening filter, reflectance standards, thickness standards and more!
Applications
Automated thin-film thickness mapping of most smooth, non-metallic film layers including:
- SiO2
- Photoresist
- SiNx
- Polymer layers
- DLC
- Polyimide
- Polysilicon
- Amorphous Silicon
Industries
Semiconductor Fabrication
- Photoresist, oxides/nitrides/SOI, wafer backgrinding
LCDs
- Cell gaps, polyimide, ITO and other TCOs
Optical Coatings
- Hardcoat thickness, Anti-reflection coating
MEMS
- Photoresist
- Silicon membranes
Look at the Industries tab for additional details.