Introducing aRTie-UV:

Affordable Reflectance, Transmittance, and Film Thickness Measurement covering 190-1100 nm

aRTie represents a breakthrough in spectral reflectometer affordability and ease-of-use. Time consuming reference readings are a thing of the past. Simply plug aRTie into your computer’s USB port and connect up the UV light source and you're ready to go. aRTie-UV's high-powered UV light source and on-board spectroscopic calibration mean that maintenance is low and measurement confidence is high.

For measuring larger samples or for sample video capabilities please see the F10-RT.

What's So Special About aRTie?

  • Reference and background steps are not required
  • High-powered (30W D2, 7W halogen) light source
  • Automatic on-board wavelength calibration
  • Measures spectral R, T, R+T, A(=1-R-T), and color of flat specular samples
  • Film thickness and refractive index analysis optional
  • 190-1100 nm wavelength range

Model Specifications for aRTie (aka F2-RT)

*Film stack dependent
**Thickness & index solving are optional
Model Thickness Range* Wavelength Range
F2-RT-UV 1nm - 40µm** 190-1100nm
F42_Model What It Measures
F2-RT-UV Reflectance and Transmittance
F2-R-UV Reflectance
F2-T-UV Transmittance