The F32 advanced-spectrometry system comes in a half-width 3U rack-mount chassis and, with additional spectrometers, can measure up to four different locations (up to two locations for -EXR and -UVX versions). The F32 software can be controlled through digital I/O or the host software to start/stop/reset measurements. Measurement data can be exported automatically to the host software for statistical process control (SPC). Filmetrics also provides optional lens assemblies for easy integration onto existing production fixtures.
Model | Thickness Range* | Wavelength Range | F32 | 15nm - 70µm | 380-1050nm |
---|---|---|
F32-EXR | 15nm - 250µm | 380-1700nm |
F32-NIR | 100nm - 250µm | 950-1700nm |
F32-UV | 1nm - 40µm | 190-1100nm |
F32-UVX | 1nm - 250µm | 190-1700nm |
F32-XT | 0.2nm - 450µm | 1440-1690nm |
F32-sX Series | 10µm- 3mm | 960-1580nm |
*film stack dependent |