Film thickness is measured in-line quickly and easily with the affordable F32-sX. Spectral analysis of reflectance from the top and bottom of your film provides thickness information in real time.

The F32-sX advanced-spectrometry system comes in a half-width 3U rack-mount chassis and, with additional spectrometers, can be configured to measure thinner films (with the VIS extension), or to measure up to two different locations. The F32-sX software can be controlled through digital I/O or the host software to start/stop/reset measurements. Measurement data can be exported automatically to the host software for statistical process control (SPC). Filmetrics^® also provides optional lens assemblies for easy integration onto existing production fixtures.

The included software and USB connectivity make installing the F32-sX onto any Windows-platform PC simple. With help from the FILMeasure software, which is preloaded with over one-hundred materials, measurements of single and multilayer stacks are easily attainable. New materials can be added quickly by measuring the optical constants of samples or by importing data from an existing source.