Map patterns can be polar, rectangular, or linear, or you can create your own with no limit on the number of measurement points. Dozens of pre-defined map patterns are supplied.
The F50 film thickness mapping system connects to the USB port of your Windows® computer and can be set up in minutes.
The different F50 instruments are distinguished primarily by thickness and wavelength range. The standard F50 is the most popular. Generally shorter wavelengths (e.g. F50-UV) are required for measurement of thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films.
Model | Thickness Range* | Wavelength Range |
---|---|---|
F50 | 20nm - 70µm | 380-1050nm |
F50-UV | 5nm - 40µm | 190-1100nm |
F50-NIR | 100nm - 250µm | 950-1700nm |
F50-EXR | 20nm - 250µm | 380-1700nm |
F50-UVX | 5nm - 250µm | 190-1700nm |
F50-XT | 0.2µm - 450µm | 1440-1690nm |
F50-s980 | 4µm - 1mm | 960-1000nm |
F50-s1310 | 7µm - 2mm | 1280-1340nm |
F50-s1550 | 10µm - 3mm | 1520-1580nm |
*film stack dependent |