Our F3 products are our newest and most advanced spectral reflectometers. They are most commonly used to measure thin-film properties by adding thickness and refractive index software modules. Thus equipped, they have all of the power of our popular F20 products, but they also benefit from on-board real-time wavelength calibration and a 40k-hour light source, meaning that long-term maintenance is essentially eliminated.
Thickness and refractive index can be measured in less than a second. Like all of our thickness measurement instruments, the F3 connects to the USB port of your Windows® computer and sets up in minutes. In fact, the standard F3 system requires no power aside from the USB connection.
The different F3 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument's wavelength range.
|Model||Thickness Range*||Wavelength Range|
|F3||15nm - 70µm||380-1050nm|
|F3-NIR||15nm - 250µm||380-1700nm|
|F3-UV||1nm - 40µm||190-1100nm|
|F3-XT||0.2nm - 450µm||1440-1690nm|
|F3-sX Series||10µm- 3mm||960-1580nm|
|*film stack dependent|